Variability and Reliability in Ultra-Scaled MOS Devices: How Should They Be Evaluated from Nanoscale to Circuit Level?

Montserrat Nafría; Rosana Rodríguez; Marc Porti; Jarvier Martín-Martínez; Mario Lanza; Xavier Aymerich; D. Bauza; D. Misra

Variability and Reliability in Ultra-Scaled MOS Devices: How Should They Be Evaluated from Nanoscale to Circuit Level?

Montserrat Nafría, Rosana Rodríguez, Marc Porti, Jarvier Martín-Martínez, Mario Lanza, Xavier Aymerich, D. Bauza, D. Misra

Departamento de Ingeniería Electrónica

Producción científica: Capítulo de libro › Capítulo › Investigación

Idioma original	Inglés
Título de la publicación alojada	Dielectrics for Nanosystems 4: Materials Science, Processing, Reliability, and Manufacturing
Lugar de publicación	Pennington (US)
Editorial	The Electrochemical Society
Páginas	225-236
Número de páginas	11
Edición	1
ISBN (versión impresa)	978-1-56677-417-8
Estado	Publicada - 1 ene 2010

Citar esto

Nafría, M., Rodríguez, R., Porti, M., Martín-Martínez, J., Lanza, M., Aymerich, X., Bauza, D., & Misra, D. (2010). Variability and Reliability in Ultra-Scaled MOS Devices: How Should They Be Evaluated from Nanoscale to Circuit Level? En Dielectrics for Nanosystems 4: Materials Science, Processing, Reliability, and Manufacturing (1 ed., pp. 225-236). The Electrochemical Society.

@inbook{8b7fc3615bce4343905163c82ce84f1f,

title = "Variability and Reliability in Ultra-Scaled MOS Devices: How Should They Be Evaluated from Nanoscale to Circuit Level?",

author = "Montserrat Nafr{\'i}a and Rosana Rodr{\'i}guez and Marc Porti and Jarvier Mart{\'i}n-Mart{\'i}nez and Mario Lanza and Xavier Aymerich and D. Bauza and D. Misra",

year = "2010",

month = jan,

day = "1",

language = "English",

isbn = "978-1-56677-417-8",

pages = "225--236",

booktitle = "Dielectrics for Nanosystems 4: Materials Science, Processing, Reliability, and Manufacturing",

publisher = "The Electrochemical Society",

edition = "1",

}