Resumen
In this letter, we analyze by means of first-principles electronic structure calculations the diffusion of B impurities in 3C-SiC. We find, through molecular dynamics, that substitutional B at a Si lattice site is readily displaced by a nearby Si interstitial by the process known as a kick-out mechanism, in agreement with recent experimental results. This is in contrast to the situation in Si, where B has recently been shown to diffuse via an interstitialcy mechanism.
| Idioma original | Inglés |
|---|---|
| Páginas (desde-hasta) | 2989-2991 |
| Número de páginas | 3 |
| Publicación | Applied Physics Letters |
| Volumen | 81 |
| N.º | 16 |
| DOI | |
| Estado | Publicada - 2002 |
Huella
Profundice en los temas de investigación de 'Theoretical evidence for the kick-out mechanism for B diffusion in SiC'. En conjunto forman una huella única.Citar esto
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver