TY - JOUR
T1 - Small-Signal Model for 2D-Material Based FETs Targeting Radio-Frequency Applications: The Importance of Considering Nonreciprocal Capacitances
AU - Pasadas, Francisco
AU - Wei, Wei
AU - Pallecchi, Emiliano
AU - Happy, Henri
AU - Jiménez, David
PY - 2017/11/1
Y1 - 2017/11/1
N2 - © 2017 IEEE. A small-signal equivalent circuit of 2D-material based FETs is presented. Charge conservation and nonreciprocal capacitances have been assumed, so the model can be used to make reliable predictions at both device and circuit levels. In this context, explicit and exact analytical expressions of the main radio-frequency figures of merit of these devices are given. Moreover, a direct parameter extraction methodology is provided based on S-parameter measurements. In addition to the intrinsic capacitances, transconductance and output conductance, our approach allows extracting the series combination of drain-source metal contact and access resistances. Accounting for these extrinsic resistances is of upmost importance when dealing with low dimensional FETs.
AB - © 2017 IEEE. A small-signal equivalent circuit of 2D-material based FETs is presented. Charge conservation and nonreciprocal capacitances have been assumed, so the model can be used to make reliable predictions at both device and circuit levels. In this context, explicit and exact analytical expressions of the main radio-frequency figures of merit of these devices are given. Moreover, a direct parameter extraction methodology is provided based on S-parameter measurements. In addition to the intrinsic capacitances, transconductance and output conductance, our approach allows extracting the series combination of drain-source metal contact and access resistances. Accounting for these extrinsic resistances is of upmost importance when dealing with low dimensional FETs.
KW - 2D materials
KW - FET
KW - charge conservation
KW - monolithic microwave integrated circuit (MMIC)
KW - radio-frequency (RF) figures of merit (FoMs)
KW - s-parameters
KW - small-signal
U2 - 10.1109/TED.2017.2749503
DO - 10.1109/TED.2017.2749503
M3 - Article
SN - 0018-9383
VL - 64
SP - 4715
EP - 4723
JO - IEEE Transactions on Electron Devices
JF - IEEE Transactions on Electron Devices
IS - 11
M1 - 8039423
ER -