Measurement of mobility and lifetime of electrons and holes in a Schottky CdTe diode

Keyphrases

• Charge Carriers 100%
• Schottky CdTe 100%
• CdTe Diodes 100%
• Room Temperature 50%
• Readout Electronics 50%
• Published Data 50%
• Bias Voltage 50%
• Drift Time 50%
• Charge Integration 50%
• Heating Process 50%
• Temperature Bias 50%
• Fixed Bias 50%
• Mobility-lifetime Product 50%
• Hecht Equation 50%

Engineering

• Charge Carrier 100%
• Measured Value 50%
• Bias Voltage 50%
• Room Temperature 50%