TY - JOUR
T1 - Measurement of mobility and lifetime of electrons and holes in a Schottky CdTe diode
AU - Ariño-Estrada, Gerard
AU - Chmeissani, Mokhtar
AU - De Lorenzo, Gianluca
AU - Kolstein, Machiel
AU - Puigdengoles, Carles
AU - García, J.
AU - Cabruja i Casas, Enric
PY - 2014
Y1 - 2014
N2 - We report on the measurement of drift properties of electrons and holes in a CdTe diode grown by the travelling heating method (THM). Mobility and lifetime of both charge carriers has been measured independently at room temperature and fixed bias voltage using charge integration readout electronics. Both electrode sides of the detector have been exposed to a 241 Am source in order to obtain events with full contributions of either electrons or holes. The drift time has been measured to obtain the mobility for each charge carrier. The Hecht equation has been employed to evaluate the lifetime. The measured values for μτ (mobility-lifetime product) are in agreement with earlier published data.
AB - We report on the measurement of drift properties of electrons and holes in a CdTe diode grown by the travelling heating method (THM). Mobility and lifetime of both charge carriers has been measured independently at room temperature and fixed bias voltage using charge integration readout electronics. Both electrode sides of the detector have been exposed to a 241 Am source in order to obtain events with full contributions of either electrons or holes. The drift time has been measured to obtain the mobility for each charge carrier. The Hecht equation has been employed to evaluate the lifetime. The measured values for μτ (mobility-lifetime product) are in agreement with earlier published data.
KW - Solid state detectors
KW - Charge transport and multiplication in solid media
KW - Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc)
UR - https://www.scopus.com/pages/publications/84950341425
U2 - 10.1088/1748-0221/9/12/C12032
DO - 10.1088/1748-0221/9/12/C12032
M3 - Article
C2 - 25729405
SN - 1748-0221
VL - 9
JO - Journal of Instrumentation
JF - Journal of Instrumentation
ER -