Function-fit model for the rate of conducting filament generation in constant voltage-stressed multilayer oxide stacks

Keyphrases

• Model Fitting 100%
• Constant Voltage 100%
• Conductive Filament 100%
• Oxide Stack 100%
• Leakage Current 50%
• First-order 50%
• Failure Rate 50%
• Aluminum Oxide 50%
• HfO2 50%
• Constant Voltage Stress 50%
• Stress-driven 50%
• Stress Voltage 50%
• Stochastic Nature 50%
• Non-homogeneous Poisson Process 50%
• Simple Function 50%
• Order Estimation 50%
• Failure Event 50%
• Device Stress 50%
• Power-law Model 50%
• Device Area 50%
• Multilayer Stack 50%
• Equivalent Circuit Representation 50%
• Arrival Rate 50%
• Multiple Breakdown 50%

Engineering

• Constant Voltage 100%
• Fit Model 100%
• Equivalent Circuit 50%
• Failure Event 50%
• Power Law Model 50%
• Arrival Rate 50%
• Failure Rate 50%
• Simple Function 50%
• Poisson Process 50%

Material Science

• Al2O3 100%
• Electronic Circuit 100%
• Oxide Compound 100%