From post-breakdown conduction to resistive switching effect in thin dielectric films

E. Miranda*, D. Jiménez, J. Suñé

*Autor correspondiente de este trabajo

Producción científica: Contribución a una revistaArtículoInvestigaciónrevisión exhaustiva

4 Citas (Scopus)

Resumen

The hysteretic nature of the filamentary electron transport in MIM/MIS resistive switching devices is modeled within the framework of the Landauer theory for mesoscopic conductors. It is shown that a two-equation system, one equation for the current-voltage (I-V) characteristic of a nano-sized constriction and a second equation for the time dependence of the confining potential yield the wide variety of I-V hysteretic behaviors reported in literature. The proposed model is consistent with a number of experimental observations and is a clear example of a nonlinear memristive system. Moreover, because of its mathematical simplicity and flexibility it is well-suited for circuit simulators.

Idioma originalInglés
Páginas (desde-hasta)GD.5.1-GD.5.6
Número de páginas6
PublicaciónIEEE International Reliability Physics Symposium Proceedings
DOI
EstadoPublicada - 2012

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