Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks
Fernando Leonel Aguirre, Eszter Piros, Nico Kaiser, Tobias Vogel, Stephan Petzold, Jonas Gehrunger, Timo Oster, Christian Hochberger, Jordi Suñé, Lambert Alff, Enrique Miranda
Profundice en los temas de investigación de 'Fast Fitting of the Dynamic Memdiode Model to the Conduction Characteristics of RRAM Devices Using Convolutional Neural Networks'. En conjunto forman una huella única.