Experimental study of the series resistance effect and its impact on the compact modeling of the conduction characteristics of HfO₂-based resistive switching memories

D. Maldonado, F. Aguirre, G. González-Cordero, A. M. Roldán, M. B. González, F. Jiménez-Molinos, F. Campabadal, E. Miranda, J. B. Roldán^*

^*Autor correspondiente de este trabajo

Producción científica: Contribución a una revista › Artículo › Investigación › revisión exhaustiva

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Experimental study of the series resistance effect and its impact on the compact modeling of the conduction characteristics of HfO2-based resistive switching memories