TY - JOUR
T1 - Characterization of antiresonant reflecting optical waveguide devices by scanning near-field optical microscopy
AU - Borrisé, Xavier
AU - Jiménez, David
AU - Pérez-Murano, Francesc
AU - Llobera, Andreu
AU - Domínguez, Carlos
AU - Barniol, Núria
PY - 2000/1/1
Y1 - 2000/1/1
N2 - Silicon-based antiresonant reflecting optical waveguide (ARROW) devices were studied by means of a scanning near-field optical microscope. Various structures such as a Y junction of a Mach–Zehnder interferometer and a directional optical coupler were characterized, showing the propagation of the light inside the devices simultaneously with the topography. Scattering on the splitting point of the Y junction was shown, as well as a partial coupling of the light between the two branches of the coupler. Measurements on the decay length of the evanescent field were also performed to study the use of the ARROW waveguide for sensor purposes. © 2000 Optical Society of America.
AB - Silicon-based antiresonant reflecting optical waveguide (ARROW) devices were studied by means of a scanning near-field optical microscope. Various structures such as a Y junction of a Mach–Zehnder interferometer and a directional optical coupler were characterized, showing the propagation of the light inside the devices simultaneously with the topography. Scattering on the splitting point of the Y junction was shown, as well as a partial coupling of the light between the two branches of the coupler. Measurements on the decay length of the evanescent field were also performed to study the use of the ARROW waveguide for sensor purposes. © 2000 Optical Society of America.
U2 - 10.1364/JOSAA.17.002243
DO - 10.1364/JOSAA.17.002243
M3 - Article
SN - 1084-7529
VL - 17
SP - 2243
EP - 2248
JO - Journal of the Optical Society of America A: Optics and Image Science, and Vision
JF - Journal of the Optical Society of America A: Optics and Image Science, and Vision
ER -