Automatic pattern generation for the electrical characterization of digital modules

Ll Ribas; J. Riera; J. M. Pérez; J. Saiz; J. Carrabina; Ll Terés

doi:10.1016/0165-6074(93)90100-Y

Automatic pattern generation for the electrical characterization of digital modules

Ll Ribas, J. Riera, J. M. Pérez, J. Saiz, J. Carrabina, Ll Terés

Producción científica: Contribución a una revista › Artículo › Investigación › revisión exhaustiva

Resumen

A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. © 1993.

Idioma original	Inglés
Páginas (desde-hasta)	255-258
Publicación	Microprocessing and Microprogramming
Volumen	39
DOI	https://doi.org/10.1016/0165-6074(93)90100-Y
Estado	Publicada - 1 ene 1993

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@article{36ce7cf29a6847afbc8d135dfaf08f3d,

title = "Automatic pattern generation for the electrical characterization of digital modules",

abstract = "A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. {\textcopyright} 1993.",

author = "Ll Ribas and J. Riera and P{\'e}rez, \{J. M.\} and J. Saiz and J. Carrabina and Ll Ter{\'e}s",

year = "1993",

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doi = "10.1016/0165-6074(93)90100-Y",

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T1 - Automatic pattern generation for the electrical characterization of digital modules

AU - Ribas, Ll

AU - Riera, J.

AU - Pérez, J. M.

AU - Saiz, J.

AU - Carrabina, J.

AU - Terés, Ll

PY - 1993/1/1

Y1 - 1993/1/1

N2 - A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. © 1993.

AB - A characterization pattern generation algorithm is presented in this paper. The generated patterns only depend on the logic description of the corresponding circuits, rather than on their physical implementations. Therefore, a high degree of technology independence is achieved. Automatic characterization tools may use such an algorithm in their front-ends for improving reliability and standardization of the corresponding characterization procedures. © 1993.

UR - https://www.scopus.com/pages/publications/0027812971

U2 - 10.1016/0165-6074(93)90100-Y

DO - 10.1016/0165-6074(93)90100-Y

M3 - Article

SN - 0165-6074

VL - 39

SP - 255

EP - 258

JO - Microprocessing and Microprogramming

JF - Microprocessing and Microprogramming

ER -

Automatic pattern generation for the electrical characterization of digital modules

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Huella

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