A capacitance and conductance measurements of two-terminal metal-oxide-semiconductor-oxide-semiconductor capacitors on silicon-on-insulator substrates

Denis Flandre; Francesca Campabadal; Joan Esteve; E. Lora-Tamayo; Febe Van de Wiele

A capacitance and conductance measurements of two-terminal metal-oxide-semiconductor-oxide-semiconductor capacitors on silicon-on-insulator substrates

Denis Flandre, Francesca Campabadal, Joan Esteve, E. Lora-Tamayo, Febe Van de Wiele

Departamento de Ingeniería Electrónica

Producción científica: Contribución a una revista › Artículo › Investigación

Idioma original	Inglés
Páginas (desde-hasta)	5111-5113
Publicación	Journal of Applied Physics
Volumen	70
N.º	9
Estado	Publicada - 1 nov 1991

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https://www.scopus.com/pages/publications/34249897423

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title = "A capacitance and conductance measurements of two-terminal metal-oxide-semiconductor-oxide-semiconductor capacitors on silicon-on-insulator substrates",

author = "Denis Flandre and Francesca Campabadal and Joan Esteve and E. Lora-Tamayo and \{Van de Wiele\}, Febe",

year = "1991",

month = nov,

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volume = "70",

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A capacitance and conductance measurements of two-terminal metal-oxide-semiconductor-oxide-semiconductor capacitors on silicon-on-insulator substrates. / Flandre, Denis; Campabadal, Francesca; Esteve, Joan et al.
En: Journal of Applied Physics, Vol. 70, N.º 9, 01.11.1991, p. 5111-5113.

Producción científica: Contribución a una revista › Artículo › Investigación

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T1 - A capacitance and conductance measurements of two-terminal metal-oxide-semiconductor-oxide-semiconductor capacitors on silicon-on-insulator substrates

AU - Flandre, Denis

AU - Campabadal, Francesca

AU - Esteve, Joan

AU - Lora-Tamayo, E.

AU - Van de Wiele, Febe

PY - 1991/11/1

Y1 - 1991/11/1

UR - https://www.scopus.com/pages/publications/34249897423

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

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