Keyphrases
Capacitive Coupling
20%
Channel Length
20%
CMOS Technology
20%
Coherent Transmission
20%
Conduction Properties
20%
Controlled Breakdown
20%
Electrical Stress
20%
Electron States
20%
Electron Transport
20%
Evalution
20%
Experimental Characterization
20%
Incoherent Scattering
20%
Lateral Gate
20%
Leakage Current
20%
Local Model
20%
Mesoscopic Effects
40%
MOSFET
100%
Nanometric
20%
NWFET
20%
Oxide Thickness
20%
Performance Specifications
20%
Point Contact
20%
Quantum Channel
20%
Quantum Conductance
20%
Quantum Electron Transport
20%
Quantum Wire
20%
Scattering Mechanism
20%
Simulation Techniques
20%
Stress Severity
20%
Thin Oxides
20%
Transistor Device
20%
Ultimate Limit
20%
Engineering
Capacitive Coupling
16%
Channel Length
16%
Contact Point
16%
Experimental Characterization
16%
Local Model
16%
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Nanoscale
33%
Oxide Thickness
16%
Quantum Channel
16%
Quantum Wire
16%
Simulation Mode
16%
Physics
Coherent Radiation
16%
Electron State
16%
Field Effect Transistor
100%
Incoherent Scattering
16%
Nanoscale
33%
Quantum Wire
16%