Keyphrases
Time-dependent Variability
100%
Random Telegraph Noise
93%
MOSFET
86%
Bias Temperature Instability
61%
Aging
57%
Resistive Switching
46%
Transistor
45%
CMOS Inverter
35%
Parameter Extraction
34%
Circuit Reliability
33%
Circuit Performance
32%
Device Level
32%
Compact Model
32%
CMOS Transistor
30%
Conductive Atomic Force Microscopy (C-AFM)
30%
Statistical Characterization
30%
Characterization Techniques
30%
HfO2
29%
RRAM Devices
28%
Analog Circuits
27%
Variability Effects
27%
Ultrathin
27%
Memristor
27%
Noise Effects
26%
Circuit Level
24%
Dielectric Breakdown
24%
Switching Phenomenon
24%
Gate Dielectric
23%
Conductive Filament
22%
Hot Carrier Injection
22%
Negative Bias Temperature Instability
22%
Reliability Simulation
22%
Threshold Voltage
22%
Integrated Circuits
21%
Threshold Voltage Shift
21%
Noise Characterization
21%
Channel Hot Carrier Stress
20%
Nanoscale CMOS
20%
FDSOI
20%
Electrical Characterization
20%
Resistive Random Access Memory (ReRAM)
20%
Off-state
20%
Transistor Array
19%
CMOS Technology
19%
Wearout
19%
High-k Dielectric
19%
Digital Circuits
19%
Aging Mechanism
19%
Neuromorphic System
18%
Measurement Setup
18%
Engineering
Metal-Oxide-Semiconductor Field-Effect Transistor
98%
Resistive
70%
Dielectrics
43%
Inverter
40%
Circuit Performance
35%
Statistical Characterization
35%
Hot Carrier Injection
33%
Nanometre
33%
Nanoscale
31%
Gate Dielectric
28%
Integrated Circuit
27%
Field Effect Transistors
26%
Conductive Filament
25%
Noise Characterization
25%
Power Amplifier
25%
SPICE
24%
Circuit Simulation
22%
Simulation Tool
22%
Conductive
22%
Negative-Bias Temperature Instability
21%
Measurement Setup
21%
Polycrystalline
20%
Aging Effect
19%
Model Parameter
18%
Performance Degradation
18%
Analog Integrated Circuits
18%
Analog Circuit
17%
Combined Effect
16%
Conductive Atomic Force Microscopy
16%
Statistical Distribution
16%
Gate Oxide
16%
Characterization Method
15%
Gate Stack
15%
Current-Voltage Characteristic
15%
Measurement Time
15%
Constant Time
15%
Digital Electronics
15%
Oscillator
15%
Atomic Force Microscope
13%
Stress Condition
12%
Digital Circuits
12%
Current Mirror
12%
Testing Time
12%
Design Phase
12%
Process Variability
12%
Stochastic Behavior
11%
Nodes
11%
Circuit Design
11%
Observables
10%
Flow Simulation
10%
