This paper deals with the preparation and characterization of YSZ layers obtained by MOCVD using Y(thd)3 and Zr(thd)4, where thd = 2,2,6,6,-tetramethyl-3,5-heptanedionate, as organometallic precursors. Yttria-stabilized zirconia (YSZ) layers deposited on porous alumina covered with LaSrMnO3 electrodes were used as solid electrolytes. Electrical characterizations were carried out by Spectral Complex Impedance measurements on multilayer devices such as air/electrode/YSZ electrolyte/electrode/Al2O3 porous/air, showing very promising results.
|Number of pages||4|
|Journal||Thin Solid Films|
|Publication status||Published - 1 Apr 1998|