Variability and Reliability in Ultra-Scaled MOS Devices: How Should They Be Evaluated from Nanoscale to Circuit Level?

Research output: Chapter in BookChapterResearch

Original languageEnglish
Title of host publicationDielectrics for Nanosystems 4: Materials Science, Processing, Reliability, and Manufacturing
Place of PublicationPennington (US)
PublisherThe Electrochemical Society
Number of pages11
ISBN (Print)978-1-56677-417-8
Publication statusPublished - 1 Jan 2004

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