Using AFM related techniques for the nanoscale electrical characterization of irradiated ultra-thin gate oxides

M. Porti, S. Gerardin, M. Nafría, X. Aymerich, A. Cester, A. Paccagnella

Research output: Contribution to journalArticleResearchpeer-review

19 Citations (Scopus)
Original languageEnglish
Pages (from-to)1891-1897
JournalIEEE Transactions on Nuclear Science
Publication statusPublished - 1 Jan 2007

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