Uniaxial anisotropy of organic thin films determined by ellipsometry

U. Heinemeyer; A. Hinderhofer; M. I. Alonso; J. O. Ossó; M. Garriga; M. Kytka; A. Gerlach; F. Schreiber

doi:10.1002/pssa.200777765

Uniaxial anisotropy of organic thin films determined by ellipsometry

U. Heinemeyer, A. Hinderhofer, M. I. Alonso, J. O. Ossó, M. Garriga, M. Kytka, A. Gerlach, F. Schreiber

Research output: Contribution to journal › Article › Research › peer-review

20 Citations (Scopus)

Abstract

Organic thin films frequently exhibit strong anisotropic optical constants, which in many cases are uniaxial with the optic axis oriented along the surface normal. The data analysis presented here to obtain the anisotropic optical constants of thin films on silicon substrates is based on the model system diindenoperylene (DIP), but nevertheless applies to all uniaxial films on SiO 2. In addition to variable angle spectroscopic ellipsometry, different substrates are used to perform a multiple sample analysis. This way of analyzing data increases the sensitivity to uniaxial anisotropy. © 2008 WILEY-VCH Verlag GmbH & Co. KGaA.

Original language	English
Pages (from-to)	927-930
Journal	Physica Status Solidi (A) Applications and Materials Science
Volume	205
Issue number	4
DOIs	https://doi.org/10.1002/pssa.200777765
Publication status	Published - 1 Apr 2008

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title = "Uniaxial anisotropy of organic thin films determined by ellipsometry",

abstract = "Organic thin films frequently exhibit strong anisotropic optical constants, which in many cases are uniaxial with the optic axis oriented along the surface normal. The data analysis presented here to obtain the anisotropic optical constants of thin films on silicon substrates is based on the model system diindenoperylene (DIP), but nevertheless applies to all uniaxial films on SiO 2. In addition to variable angle spectroscopic ellipsometry, different substrates are used to perform a multiple sample analysis. This way of analyzing data increases the sensitivity to uniaxial anisotropy. {\textcopyright} 2008 WILEY-VCH Verlag GmbH & Co. KGaA.",

author = "U. Heinemeyer and A. Hinderhofer and Alonso, {M. I.} and Oss{\'o}, {J. O.} and M. Garriga and M. Kytka and A. Gerlach and F. Schreiber",

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doi = "10.1002/pssa.200777765",

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T1 - Uniaxial anisotropy of organic thin films determined by ellipsometry

AU - Heinemeyer, U.

AU - Hinderhofer, A.

AU - Alonso, M. I.

AU - Ossó, J. O.

AU - Garriga, M.

AU - Kytka, M.

AU - Gerlach, A.

AU - Schreiber, F.

PY - 2008/4/1

Y1 - 2008/4/1

N2 - Organic thin films frequently exhibit strong anisotropic optical constants, which in many cases are uniaxial with the optic axis oriented along the surface normal. The data analysis presented here to obtain the anisotropic optical constants of thin films on silicon substrates is based on the model system diindenoperylene (DIP), but nevertheless applies to all uniaxial films on SiO 2. In addition to variable angle spectroscopic ellipsometry, different substrates are used to perform a multiple sample analysis. This way of analyzing data increases the sensitivity to uniaxial anisotropy. © 2008 WILEY-VCH Verlag GmbH & Co. KGaA.

AB - Organic thin films frequently exhibit strong anisotropic optical constants, which in many cases are uniaxial with the optic axis oriented along the surface normal. The data analysis presented here to obtain the anisotropic optical constants of thin films on silicon substrates is based on the model system diindenoperylene (DIP), but nevertheless applies to all uniaxial films on SiO 2. In addition to variable angle spectroscopic ellipsometry, different substrates are used to perform a multiple sample analysis. This way of analyzing data increases the sensitivity to uniaxial anisotropy. © 2008 WILEY-VCH Verlag GmbH & Co. KGaA.

U2 - 10.1002/pssa.200777765

DO - 10.1002/pssa.200777765

M3 - Article

SN - 1862-6300

VL - 205

SP - 927

EP - 930

JO - Physica Status Solidi (A) Applications and Materials Science

JF - Physica Status Solidi (A) Applications and Materials Science

IS - 4

ER -

Uniaxial anisotropy of organic thin films determined by ellipsometry

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