Organic thin films frequently exhibit strong anisotropic optical constants, which in many cases are uniaxial with the optic axis oriented along the surface normal. The data analysis presented here to obtain the anisotropic optical constants of thin films on silicon substrates is based on the model system diindenoperylene (DIP), but nevertheless applies to all uniaxial films on SiO 2. In addition to variable angle spectroscopic ellipsometry, different substrates are used to perform a multiple sample analysis. This way of analyzing data increases the sensitivity to uniaxial anisotropy. © 2008 WILEY-VCH Verlag GmbH & Co. KGaA.
|Journal||Physica Status Solidi (A) Applications and Materials Science|
|Publication status||Published - 1 Apr 2008|