Uniaxial anisotropy of organic thin films determined by ellipsometry

U. Heinemeyer, A. Hinderhofer, M. I. Alonso, J. O. Ossó, M. Garriga, M. Kytka, A. Gerlach, F. Schreiber

    Research output: Contribution to journalArticleResearchpeer-review

    19 Citations (Scopus)

    Abstract

    Organic thin films frequently exhibit strong anisotropic optical constants, which in many cases are uniaxial with the optic axis oriented along the surface normal. The data analysis presented here to obtain the anisotropic optical constants of thin films on silicon substrates is based on the model system diindenoperylene (DIP), but nevertheless applies to all uniaxial films on SiO 2. In addition to variable angle spectroscopic ellipsometry, different substrates are used to perform a multiple sample analysis. This way of analyzing data increases the sensitivity to uniaxial anisotropy. © 2008 WILEY-VCH Verlag GmbH & Co. KGaA.
    Original languageEnglish
    Pages (from-to)927-930
    JournalPhysica Status Solidi (A) Applications and Materials Science
    Volume205
    Issue number4
    DOIs
    Publication statusPublished - 1 Apr 2008

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