Understanding and optimization of hot-carrier reliability in Germanium-on-Silicon pMOSFETs

Debabrata Maji, Felice Crupi, Esteve Amat, Eddy Simoen, Brice De Jaeger, David P. Brunco, C. R. Manoj, V. Ramgopal Rao, Paolo Magnone, Gino Giusi, Calogero Pace, Luigi Pantisano, Jérôme Mitard, Rosana Rodríguez, Montserrat Nafría

Research output: Contribution to journalArticleResearchpeer-review

20 Citations (Scopus)

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Engineering & Materials Science

Chemistry