| Original language | English |
|---|---|
| Pages (from-to) | 1127-1131 |
| Journal | Microelectronics Reliability |
| Volume | 38 |
| Publication status | Published - 1 Jun 1998 |
Two-Step Stress Method for the Dynamic Testing of Very Thin (8nm) SiO2 Films
R. Rodríguez, E. Miranda, M. Nafría, J. Suñé, X. Aymerich
Research output: Contribution to journal › Article › Research
1
Citation
(Scopus)