Transient analysis of resonant tunneling diodes in the self consistent Wigner distribution formalism.: Proceeding of the II-V SemiconductorDevices Simulation Workshop

J García; X Oriols; F Martin; J Suñé; T Gonzalez; J Mateos; D Pardo

Transient analysis of resonant tunneling diodes in the self consistent Wigner distribution formalism. Proceeding of the II-V SemiconductorDevices Simulation Workshop

J García, X Oriols, F Martin, J Suñé, T Gonzalez, J Mateos, D Pardo

Research output: Book/Report › Proceeding › Research

Original language	Undefined/Unknown
Place of Publication	- (IT)
Number of pages	1
Publication status	Published - Jul 1997

Cite this

@book{a9773f0dcb82404b83378398af68d79f,

title = "Transient analysis of resonant tunneling diodes in the self consistent Wigner distribution formalism.: Proceeding of the II-V SemiconductorDevices Simulation Workshop",

author = "J Garc{\'i}a and X Oriols and F Martin and J Su{\~n}{\'e} and T Gonzalez and J Mateos and D Pardo",

year = "1997",

month = jul,

language = "Indefinido/desconocido",

}

TY - BOOK

T1 - Transient analysis of resonant tunneling diodes in the self consistent Wigner distribution formalism.

T2 - Proceeding of the II-V SemiconductorDevices Simulation Workshop

AU - García, J

AU - Oriols, X

AU - Martin, F

AU - Suñé, J

AU - Gonzalez, T

AU - Mateos, J

AU - Pardo, D

PY - 1997/7

Y1 - 1997/7

M3 - Libro de Actas

BT - Transient analysis of resonant tunneling diodes in the self consistent Wigner distribution formalism.

CY - - (IT)

ER -