Topographic characterization of AFM grown SiO2 on Si

X. Blasco, D. Hill, M. Porti, M. Nafría, X. Aymerich

    Research output: Contribution to journalArticleResearch

    18 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)110-112
    JournalNanotechnology
    Volume12
    DOIs
    Publication statusPublished - 1 Jan 2001

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