Abstract
We report on real-time measurements of the crystallization process of highly ordered thin films of the molecular organic radical p-nitrophenyl nitronyl nitroxide (p-NPNN) grown from the vapor phase on glass substrates. The films exhibit 2D spherulitic morphology with a low density of nucleation centers. This low density allows an accurate determination of the time evolution of the spherulites radii, which show a non-linear dependence with time. The non-linearity is more pronounced for small values of the film thickness and is due to the non-negligible contribution of the interfacial energies at the beginning of the crystallization process. As time evolves the film thickness increases and the dependence becomes nearly linear (in-plane growth rate almost constant).
Original language | English |
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Pages (from-to) | 146-158 |
Journal | Journal of Crystal Growth |
Volume | 209 |
Issue number | 1 |
DOIs | |
Publication status | Published - 15 Jan 2000 |