Theoretical and experimental investigations of single- and multilayer structures with SiGe nanoislands

V. O. Yukhymchuk; A. M. Yaremko; M. Ya Valakh; A. V. Novikov; E. V. Mozdor; P. M. Lytvyn; Z. F. Krasilnik; V. P. Klad'ko; V. M. Dzhagan; N. Mestres; J. Pascual

doi:10.1016/j.msec.2003.09.156

Theoretical and experimental investigations of single- and multilayer structures with SiGe nanoislands

V. O. Yukhymchuk, A. M. Yaremko, M. Ya Valakh, A. V. Novikov, E. V. Mozdor, P. M. Lytvyn, Z. F. Krasilnik, V. P. Klad'ko, V. M. Dzhagan, N. Mestres, J. Pascual

Department of Physics

Research output: Contribution to journal › Article › Research › peer-review

9 Citations (Scopus)

Abstract

The influence of geometrical and physical parameters of self-assembled SiGe/Si nanoislands on their energy has been investigated theoretically. The island energy minimum was shown to depend on the growth temperature and Si content in the islands. The results of the theoretical calculations are compared with experimental data obtained by atomic force microscopy and Raman spectroscopy (RS). © 2003 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	1027-1031
Journal	Materials Science and Engineering C
Volume	23
Issue number	6-8
DOIs	https://doi.org/10.1016/j.msec.2003.09.156
Publication status	Published - 15 Dec 2003

Keywords

AFM
Elastic strain
GeSi nanoislads
Raman
X-ray

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Yukhymchuk, V. O., Yaremko, A. M., Valakh, M. Y., Novikov, A. V., Mozdor, E. V., Lytvyn, P. M., Krasilnik, Z. F., Klad'ko, V. P., Dzhagan, V. M., Mestres, N., & Pascual, J. (2003). Theoretical and experimental investigations of single- and multilayer structures with SiGe nanoislands. Materials Science and Engineering C, 23(6-8), 1027-1031. https://doi.org/10.1016/j.msec.2003.09.156

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abstract = "The influence of geometrical and physical parameters of self-assembled SiGe/Si nanoislands on their energy has been investigated theoretically. The island energy minimum was shown to depend on the growth temperature and Si content in the islands. The results of the theoretical calculations are compared with experimental data obtained by atomic force microscopy and Raman spectroscopy (RS). {\textcopyright} 2003 Elsevier B.V. All rights reserved.",

keywords = "AFM, Elastic strain, GeSi nanoislads, Raman, X-ray",

author = "Yukhymchuk, {V. O.} and Yaremko, {A. M.} and Valakh, {M. Ya} and Novikov, {A. V.} and Mozdor, {E. V.} and Lytvyn, {P. M.} and Krasilnik, {Z. F.} and Klad'ko, {V. P.} and Dzhagan, {V. M.} and N. Mestres and J. Pascual",

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Theoretical and experimental investigations of single- and multilayer structures with SiGe nanoislands. / Yukhymchuk, V. O.; Yaremko, A. M.; Valakh, M. Ya; Novikov, A. V.; Mozdor, E. V.; Lytvyn, P. M.; Krasilnik, Z. F.; Klad'ko, V. P.; Dzhagan, V. M.; Mestres, N.; Pascual, J.

In: Materials Science and Engineering C, Vol. 23, No. 6-8, 15.12.2003, p. 1027-1031.

Research output: Contribution to journal › Article › Research › peer-review

TY - JOUR

T1 - Theoretical and experimental investigations of single- and multilayer structures with SiGe nanoislands

AU - Yukhymchuk, V. O.

AU - Yaremko, A. M.

AU - Valakh, M. Ya

AU - Novikov, A. V.

AU - Mozdor, E. V.

AU - Lytvyn, P. M.

AU - Krasilnik, Z. F.

AU - Klad'ko, V. P.

AU - Dzhagan, V. M.

AU - Mestres, N.

AU - Pascual, J.

PY - 2003/12/15

Y1 - 2003/12/15

N2 - The influence of geometrical and physical parameters of self-assembled SiGe/Si nanoislands on their energy has been investigated theoretically. The island energy minimum was shown to depend on the growth temperature and Si content in the islands. The results of the theoretical calculations are compared with experimental data obtained by atomic force microscopy and Raman spectroscopy (RS). © 2003 Elsevier B.V. All rights reserved.

AB - The influence of geometrical and physical parameters of self-assembled SiGe/Si nanoislands on their energy has been investigated theoretically. The island energy minimum was shown to depend on the growth temperature and Si content in the islands. The results of the theoretical calculations are compared with experimental data obtained by atomic force microscopy and Raman spectroscopy (RS). © 2003 Elsevier B.V. All rights reserved.

KW - AFM

KW - Elastic strain

KW - GeSi nanoislads

KW - Raman

KW - X-ray

U2 - 10.1016/j.msec.2003.09.156

DO - 10.1016/j.msec.2003.09.156

M3 - Article

VL - 23

SP - 1027

EP - 1031

JO - Materials Science and Engineering C

JF - Materials Science and Engineering C

SN - 0928-4931

IS - 6-8

ER -