Original language | English |
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Pages (from-to) | 1807-1808 |
Journal | Microelectronics and Reliability |
Volume | 45 |
Issue number | 12 |
DOIs | |
Publication status | Published - 1 Dec 2005 |
The TDDB power-law model-Physics and experimental evidences
R.-P. Vollertsen, E. Miranda
Research output: Contribution to journal › Article › Research
2
Citations
(Scopus)