The measurement of the tip current noise as a method to characterize the exposed area of coated ESTM tips

Gabriel Abadal, Francesc Pérez-Murano, Nuria Barniol, X. Aymerich

Research output: Contribution to journalArticleResearchpeer-review

6 Citations (Scopus)

Abstract

A new method to characterize the uncoated area of electrochemical scanning tunneling microscopy (ESTM) tips based on the measurement of the rms tip current noise is presented. A clear relationship between this noise and the exposed area measured by means of different standard techniques is shown. A simple model based on the tip-electrolyte system allows adjustment of the relationship. The new technique is advantageous with respect to the standard methods because it is nondestructive and because it can be applied in situ during an ESTM experiment, allowing continuous monitoring of the tip coating state.
Original languageEnglish
Pages (from-to)859-864
JournalIEEE Transactions on Instrumentation and Measurement
Volume52
DOIs
Publication statusPublished - 1 Jun 2003

Keywords

  • Current noise
  • Electrochemical scanning tunneling microscopy
  • Electrochemical scanning tunneling microscopy (ESTM) tip coating
  • Exposed tip area
  • Nanotechnology
  • Scanning probe microscopy
  • Ultramicroelectrodes

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