The impact of gate-oxide breakdown SRAM stability

R. Rodríguez, J. H. Stathis, B. P. Linder, S. Kowalczyk, C. T. Chuang, R. V. Joshi, G. Northrop, K. Bernstein, A. J. Bhavnagarwala, S. Lombardo

    Research output: Contribution to journal › Article › Research › peer-review

    124 Citations (Scopus)

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    Engineering & Materials Science

    Chemistry