Testability enhancement usign physical design rules in a CMOS cell library

    Research output: Chapter in BookChapterResearch

    Original languageEnglish
    Title of host publicationProceedings del International Conference on Quality in Electronic Component, Failure Prevention, Detection and Analysis, and European Symposium on Realibility of Electronic Devices, Failure Physics an
    Pages607-612
    Number of pages5
    Edition1
    Publication statusPublished - 1 Jan 1993

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