Test Pattern Generator for NMOS Integrated Circuits.

Carles Ferrer Ramis, Jean Pierre Deschamps, Joan Oliver Malagelada, Jordi Carrabina Bordoll, Elena Valderrama Valles

Research output: Contribution to journal › Article › Research › peer-review

Fingerprint

Dive into the research topics of 'Test Pattern Generator for NMOS Integrated Circuits.'. Together they form a unique fingerprint.

Engineering

Computer Science

Physics

Earth and Planetary Sciences