Surface morphology of organic thin films

J. Fraxedas, J. Caro, J. Santiso, A. Figueras, P. Gorostiza, F. Sanz

    Research output: Contribution to journalArticleResearchpeer-review

    3 Citations (Scopus)

    Abstract

    Highly oriented thin films of tetrathiafulvalene tetracyanoquinodimethane (TTF-TCNQ) and of p-nitrophenyl nitronyl nitroxide (p-NPNN) have been grown on alkali halide substrates by vapor deposition techniques. Their surfaces reveal clearly differentiated morphologies, as measured with tapping mode atomic force microscopy (TMAFM), exhibiting different kinds of defects. However, the films order in similar layered molecular structures parallel to the substrate plane. © 1999 Elsevier Science B.V. All rights reserved.
    Original languageEnglish
    Pages (from-to)623-626
    JournalApplied Surface Science
    Volume144-145
    DOIs
    Publication statusPublished - 1 Jan 1999

    Keywords

    • Atomic force microscopy
    • Morphology
    • Roughness and topography
    • Surface defects
    • Surface structure

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