Surface morphology of organic thin films

J. Fraxedas; J. Caro; J. Santiso; A. Figueras; P. Gorostiza; F. Sanz

doi:10.1016/S0169-4332(98)00878-2

Surface morphology of organic thin films

J. Fraxedas, J. Caro, J. Santiso, A. Figueras, P. Gorostiza, F. Sanz

Research output: Contribution to journal › Article › Research › peer-review

3 Citations (Scopus)

Abstract

Highly oriented thin films of tetrathiafulvalene tetracyanoquinodimethane (TTF-TCNQ) and of p-nitrophenyl nitronyl nitroxide (p-NPNN) have been grown on alkali halide substrates by vapor deposition techniques. Their surfaces reveal clearly differentiated morphologies, as measured with tapping mode atomic force microscopy (TMAFM), exhibiting different kinds of defects. However, the films order in similar layered molecular structures parallel to the substrate plane. © 1999 Elsevier Science B.V. All rights reserved.

Original language	English
Pages (from-to)	623-626
Journal	Applied Surface Science
Volume	144-145
DOIs	https://doi.org/10.1016/S0169-4332(98)00878-2
Publication status	Published - 1 Jan 1999

Keywords

Atomic force microscopy
Morphology
Roughness and topography
Surface defects
Surface structure

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10.1016/S0169-4332(98)00878-2

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title = "Surface morphology of organic thin films",

abstract = "Highly oriented thin films of tetrathiafulvalene tetracyanoquinodimethane (TTF-TCNQ) and of p-nitrophenyl nitronyl nitroxide (p-NPNN) have been grown on alkali halide substrates by vapor deposition techniques. Their surfaces reveal clearly differentiated morphologies, as measured with tapping mode atomic force microscopy (TMAFM), exhibiting different kinds of defects. However, the films order in similar layered molecular structures parallel to the substrate plane. {\textcopyright} 1999 Elsevier Science B.V. All rights reserved.",

keywords = "Atomic force microscopy, Morphology, Roughness and topography, Surface defects, Surface structure",

author = "J. Fraxedas and J. Caro and J. Santiso and A. Figueras and P. Gorostiza and F. Sanz",

year = "1999",

month = jan,

day = "1",

doi = "10.1016/S0169-4332(98)00878-2",

language = "English",

volume = "144-145",

pages = "623--626",

journal = "Applied Surface Science",

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TY - JOUR

T1 - Surface morphology of organic thin films

AU - Fraxedas, J.

AU - Caro, J.

AU - Santiso, J.

AU - Figueras, A.

AU - Gorostiza, P.

AU - Sanz, F.

PY - 1999/1/1

Y1 - 1999/1/1

N2 - Highly oriented thin films of tetrathiafulvalene tetracyanoquinodimethane (TTF-TCNQ) and of p-nitrophenyl nitronyl nitroxide (p-NPNN) have been grown on alkali halide substrates by vapor deposition techniques. Their surfaces reveal clearly differentiated morphologies, as measured with tapping mode atomic force microscopy (TMAFM), exhibiting different kinds of defects. However, the films order in similar layered molecular structures parallel to the substrate plane. © 1999 Elsevier Science B.V. All rights reserved.

AB - Highly oriented thin films of tetrathiafulvalene tetracyanoquinodimethane (TTF-TCNQ) and of p-nitrophenyl nitronyl nitroxide (p-NPNN) have been grown on alkali halide substrates by vapor deposition techniques. Their surfaces reveal clearly differentiated morphologies, as measured with tapping mode atomic force microscopy (TMAFM), exhibiting different kinds of defects. However, the films order in similar layered molecular structures parallel to the substrate plane. © 1999 Elsevier Science B.V. All rights reserved.

KW - Atomic force microscopy

KW - Morphology

KW - Roughness and topography

KW - Surface defects

KW - Surface structure

U2 - 10.1016/S0169-4332(98)00878-2

DO - 10.1016/S0169-4332(98)00878-2

M3 - Article

VL - 144-145

SP - 623

EP - 626

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

ER -

Surface morphology of organic thin films

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Keywords

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