Abstract
Highly oriented thin films of tetrathiafulvalene tetracyanoquinodimethane (TTF-TCNQ) and of p-nitrophenyl nitronyl nitroxide (p-NPNN) have been grown on alkali halide substrates by vapor deposition techniques. Their surfaces reveal clearly differentiated morphologies, as measured with tapping mode atomic force microscopy (TMAFM), exhibiting different kinds of defects. However, the films order in similar layered molecular structures parallel to the substrate plane. © 1999 Elsevier Science B.V. All rights reserved.
Original language | English |
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Pages (from-to) | 623-626 |
Journal | Applied Surface Science |
Volume | 144-145 |
DOIs | |
Publication status | Published - 1 Jan 1999 |
Keywords
- Atomic force microscopy
- Morphology
- Roughness and topography
- Surface defects
- Surface structure