Surface morphology of grown thin films of the quasi one-dimensional organic conductor TTF-TCNQ studied by atomic force microscopy

J. Fraxedas, J. Caro, A. Figueras, P. Gorostiza, F. Sanz

    Research output: Contribution to journalArticleResearchpeer-review

    12 Citations (Scopus)

    Abstract

    Thin films of the quasi one-dimensional organic conductor TTF-TCNQ grown on KCl (001) substrates by Chemical Vapor Deposition has been analyzed with Atomic Force Microscopy. The films are polycrystalline, composed of microcrystals with rectangular shape with the c* crystallographic axis perpendicular to the substrate. The stepped surface morphology of the microcrystals has been studied. The growth of the films is strongly dominated by an oriented nucleation and the one-dimensional nature of the compound. © 1998 Elsevier Science B.V.
    Original languageEnglish
    Pages (from-to)205-215
    JournalSurface Science
    Volume395
    Issue number2-3
    DOIs
    Publication statusPublished - 12 Jan 1998

    Keywords

    • Atomic force microscopy
    • Chemical vapor deposition: Stepped single crystal surfaces
    • Surface morphology

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