18O diffusion through amorphous SiO2 and cristobalite

J. Rodríguez-Viejo, F. Sibieude, M. T. Clavaguera-Mora, C. Monty

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Secondary ion mass spectrometry was used to profile the diffusion of oxygen in polycrystalline β-cristobalite and vitreous SiO2. The tracer concentration profiles of cristobalite are consistent with a model based on two mechanisms: bulk and short-circuit diffusion. The profiles of partially crystallized samples containing vitreous SiO2 and β-cristobalite were fitted using the sum of two complementary error functions and taking account of some interstitial-network exchange. The bulk oxygen diffusivity, in the temperature range 1240-1500°C, is about five times greater for vitreous silica than for β-cristobalite.
Original languageEnglish
Pages (from-to)1906-1908
JournalApplied physics letters
Publication statusPublished - 1 Dec 1993


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