18O diffusion through amorphous SiO2 and cristobalite

J. Rodríguez-Viejo; F. Sibieude; M. T. Clavaguera-Mora; C. Monty

doi:https://doi.org/10.1063/1.110644

¹⁸O diffusion through amorphous SiO₂ and cristobalite

J. Rodríguez-Viejo, F. Sibieude, M. T. Clavaguera-Mora, C. Monty

Department of Physics

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Abstract

Secondary ion mass spectrometry was used to profile the diffusion of oxygen in polycrystalline β-cristobalite and vitreous SiO2. The tracer concentration profiles of cristobalite are consistent with a model based on two mechanisms: bulk and short-circuit diffusion. The profiles of partially crystallized samples containing vitreous SiO2 and β-cristobalite were fitted using the sum of two complementary error functions and taking account of some interstitial-network exchange. The bulk oxygen diffusivity, in the temperature range 1240-1500°C, is about five times greater for vitreous silica than for β-cristobalite.

Original language	English
Pages (from-to)	1906-1908
Journal	Applied physics letters
Volume	63
DOIs	https://doi.org/10.1063/1.110644
Publication status	Published - 1 Dec 1993

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title = "18O diffusion through amorphous SiO2 and cristobalite",

abstract = "Secondary ion mass spectrometry was used to profile the diffusion of oxygen in polycrystalline β-cristobalite and vitreous SiO2. The tracer concentration profiles of cristobalite are consistent with a model based on two mechanisms: bulk and short-circuit diffusion. The profiles of partially crystallized samples containing vitreous SiO2 and β-cristobalite were fitted using the sum of two complementary error functions and taking account of some interstitial-network exchange. The bulk oxygen diffusivity, in the temperature range 1240-1500°C, is about five times greater for vitreous silica than for β-cristobalite.",

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year = "1993",

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doi = "https://doi.org/10.1063/1.110644",

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T1 - 18O diffusion through amorphous SiO2 and cristobalite

AU - Rodríguez-Viejo, J.

AU - Sibieude, F.

AU - Clavaguera-Mora, M. T.

AU - Monty, C.

PY - 1993/12/1

Y1 - 1993/12/1

N2 - Secondary ion mass spectrometry was used to profile the diffusion of oxygen in polycrystalline β-cristobalite and vitreous SiO2. The tracer concentration profiles of cristobalite are consistent with a model based on two mechanisms: bulk and short-circuit diffusion. The profiles of partially crystallized samples containing vitreous SiO2 and β-cristobalite were fitted using the sum of two complementary error functions and taking account of some interstitial-network exchange. The bulk oxygen diffusivity, in the temperature range 1240-1500°C, is about five times greater for vitreous silica than for β-cristobalite.

AB - Secondary ion mass spectrometry was used to profile the diffusion of oxygen in polycrystalline β-cristobalite and vitreous SiO2. The tracer concentration profiles of cristobalite are consistent with a model based on two mechanisms: bulk and short-circuit diffusion. The profiles of partially crystallized samples containing vitreous SiO2 and β-cristobalite were fitted using the sum of two complementary error functions and taking account of some interstitial-network exchange. The bulk oxygen diffusivity, in the temperature range 1240-1500°C, is about five times greater for vitreous silica than for β-cristobalite.

U2 - https://doi.org/10.1063/1.110644

DO - https://doi.org/10.1063/1.110644

M3 - Article

VL - 63

SP - 1906

EP - 1908

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

ER -

18O diffusion through amorphous SiO2 and cristobalite

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¹⁸O diffusion through amorphous SiO₂ and cristobalite