Successive Oxide Breakdown Statistics : Correlation Effects, Reliability Methodologies, and Their Limits

Research output: Contribution to journalArticleResearch

28 Citations (Scopus)
Original languageEnglish
Pages (from-to)1584-1592
JournalIEEE Transactions on Electron Devices
Volume51
Publication statusPublished - 1 Jan 2004

Cite this

Suñe Tarruella, J. F., Wu, E. Y., & Lai, W. L. (2004). Successive Oxide Breakdown Statistics : Correlation Effects, Reliability Methodologies, and Their Limits. IEEE Transactions on Electron Devices, 51, 1584-1592.