| Original language | English |
|---|---|
| Pages (from-to) | 1584-1592 |
| Journal | IEEE Transactions on Electron Devices |
| Volume | 51 |
| Publication status | Published - 1 Jan 2004 |
Successive Oxide Breakdown Statistics : Correlation Effects, Reliability Methodologies, and Their Limits
Jorge Francisco Suñe Tarruella, E.Y. Wu, W.L. Lai
Research output: Contribution to journal › Article › Research
30
Citations
(Scopus)