Original language | English |
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Pages (from-to) | 1584-1592 |
Journal | IEEE Transactions on Electron Devices |
Volume | 51 |
Publication status | Published - 1 Jan 2004 |
Successive Oxide Breakdown Statistics : Correlation Effects, Reliability Methodologies, and Their Limits
Jorge Francisco Suñe Tarruella, E.Y. Wu, W.L. Lai
Research output: Contribution to journal › Article › Research
30
Citations
(Scopus)