| Original language | English |
|---|---|
| Pages (from-to) | 1584-1592 |
| Journal | IEEE Transactions on Electron Devices |
| Volume | 51 |
| Publication status | Published - 1 Jan 2004 |
Cite this
Suñe Tarruella, J. F., Wu, E. Y., & Lai, W. L. (2004). Successive Oxide Breakdown Statistics : Correlation Effects, Reliability Methodologies, and Their Limits. IEEE Transactions on Electron Devices, 51, 1584-1592.