| Original language | English |
|---|---|
| Pages (from-to) | 488-491 |
| Journal | Microelectronic Engineering |
| Volume | 98 |
| Publication status | Published - 1 Jan 2012 |
Stress mapping on the porous silicon microcapsules by Raman microscopy
Nuria Torras Andres
Research output: Contribution to journal › Article › Research
13
Citations
(Scopus)