Original language | English |
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Pages (from-to) | 488-491 |
Journal | Microelectronic Engineering |
Volume | 98 |
Publication status | Published - 1 Jan 2012 |
Stress mapping on the porous silicon microcapsules by Raman microscopy
Nuria Torras Andres
Research output: Contribution to journal › Article › Research
13
Citations
(Scopus)