Statistics of Successive Breakdown Events in Gate Oxides

J. Suñé, E. Wu

    Research output: Contribution to journalArticleResearch

    67 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)272-274
    JournalIEEE Electron Device Letters
    Volume24
    DOIs
    Publication statusPublished - 1 Jan 2003

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