Statistical and voltage scaling properties of post-breakdown for ultr-thin-oxide PFETs in invesion mode

E. Wu, J. Suñé

    Research output: Contribution to journalArticleResearch

    9 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)54-62
    JournalIEEE Int. Reliab. Phys. Symp. proc.
    Volume1
    DOIs
    Publication statusPublished - 1 Jan 2006

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