SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors

E. Amat, M.B. Gonzalez, P. Verheyen, R. Rodríguez, M. Nafria, X. Aymerich, E. Simoen, Javier Martin Martinez

Research output: Contribution to journalArticleResearch

Original languageEnglish
Pages (from-to)1263-1266
JournalMicroelectronics Reliability
Volume50
DOIs
Publication statusPublished - 1 Jan 2010

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