Original language | English |
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Pages (from-to) | 1263-1266 |
Journal | Microelectronics Reliability |
Volume | 50 |
DOIs | |
Publication status | Published - 1 Jan 2010 |
SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors
E. Amat, M.B. Gonzalez, P. Verheyen, R. Rodríguez, M. Nafria, X. Aymerich, E. Simoen, Javier Martin Martinez
Research output: Contribution to journal › Article › Research