SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors

Research output: Contribution to journal › Article › Research

Original language	English
Pages (from-to)	1263-1266
Journal	Microelectronics Reliability
Volume	50
DOIs	https://doi.org/10.1016/j.microrel.2010.07.150
Publication status	Published - 1 Jan 2010

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@article{3de65d95939249f6822ef1cc451b008d,

title = "SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors",

author = "E. Amat and M.B. Gonzalez and P. Verheyen and R. Rodr{\'i}guez and M. Nafria and X. Aymerich and E. Simoen and {Martin Martinez}, Javier",

year = "2010",

month = jan,

day = "1",

doi = "10.1016/j.microrel.2010.07.150",

language = "English",

volume = "50",

pages = "1263--1266",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Limited",

}

TY - JOUR

T1 - SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors

AU - Amat, E.

AU - Gonzalez, M.B.

AU - Verheyen, P.

AU - Rodríguez, R.

AU - Nafria, M.

AU - Aymerich, X.

AU - Simoen, E.

AU - Martin Martinez, Javier

PY - 2010/1/1

Y1 - 2010/1/1

U2 - 10.1016/j.microrel.2010.07.150

DO - 10.1016/j.microrel.2010.07.150

M3 - Article

VL - 50

SP - 1263

EP - 1266

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

ER -