Spectroscopic ellipsometry studies on polycrystalline Cd <inf>0.9</inf>Zn<inf>0.1</inf>Te thin films

Madana Gurusamy Sridharan, M. Mekaladevi, J. Rodriguez-Viejo, Sa K. Narayandass, D. Mangalaraj, Hee Chul Lee

Research output: Contribution to journalArticleResearchpeer-review

Abstract

The pseudodielectric-function spectra, ε(E) = ε1(E) + iε2(E), of polycrystalline Cd0.9Zn0.1Te thin films in the 1.7-5.5 eV photon energy range were measured by spectroscopic ellipsometry. The measured dielectric function spectra reveal distinct structures at energies of the E1, E1 + δ1 and E2critical points due to interband transitions. The vacuum evaporated Cd0.9Zn0.1Te thin films exhibited zinc-blende structure with predominant (111) orientation. The rms roughness of the film evaluated by an ex-situ atomic force microscopy is 3.7 nm. Dielectric related optical constants, determined from the spectroscopic ellipsometry data are presented and analyzed. The optical constants of the film were also determined by using optical transmittance measurements, and results were discussed. © 2004 WILEY-VCH Verlag GmbH & Co. KGaA. Weinheim.
Original languageEnglish
Pages (from-to)782-790
JournalPhysica Status Solidi (A) Applied Research
Volume201
DOIs
Publication statusPublished - 1 Mar 2004

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