Size-dependent melting and supercooling of Ge nanoparticles embedded in a SiO<inf>2</inf> thin film

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Abstract

Melting of Ge nanocrystals embedded in a 20 nm SiO2 film is analyzed using a highly sensitive nanocalorimetric technique. Fast heating rates of ∼5 × 104 K/s between room temperature and 1200 K and cooling rates of 8 × 103 K/s at the onset of solidification are used to probe the phase transitions. A melting point reduction of 125 K with respect to the bulk melting temperature is observed upon heating. A size-dependent supercooling has also been observed with an onset of solidification that ranges from 890 to 935 K depending on the maximum size of the previously melted nanoparticles. For a given nanocrystal size the melting hysteresis is around 225 K. © 2007 Elsevier B.V. All rights reserved.
Original languageEnglish
Pages (from-to)82-87
JournalThermochimica Acta
Volume461
DOIs
Publication statusPublished - 15 Sep 2007

Keywords

  • Fast scanning nanocalorimetry
  • Ge nanoparticles
  • Melting and solidification
  • Size-dependent supercooling

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