Simulation of the time-dependent breakdown characteristics of heavy-ion irradiated gate oxides using a mean-reverting Poisson-Gaussian process

E. Miranda, A. Cester, J. Suñé, A. Paccagnella, and G. Ghidini

Research output: Contribution to journalArticleResearch

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)1462-1467
JournalIEEE Transactions on Nuclear Science
Publication statusPublished - 1 Jan 2005

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