Simulation of the hot-carrier degradation in short channel transistors with high-K dielectric

E. Amat, T. Kauerauf, R. Degraeve, R. Rodríguez, M. Nafría, X. Aymerich, G. Groeseneken

Research output: Contribution to journalArticleResearch

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)315-323
JournalInternational journal of numerical modelling (Print)
Issue number4-5
Publication statusPublished - 1 Jun 2010

Cite this