Semi-empirical modelling of the post-breakdown current-voltage characteristics of ultra-thin oxides in MOS structures

E. Miranda, B. Brandala

Research output: Contribution to journalArticleResearch

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)175-178
JournalMicroelectronics and Reliability
Volume45
Publication statusPublished - 1 Jan 2004

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