| Original language | English |
|---|---|
| Pages (from-to) | 12-22 |
| Journal | SPIE Press |
| Volume | 2648 |
| Issue number | 0 |
| Publication status | Published - 1 Jan 1995 |
Roughness Effects in the Infrared Reflectance of Thick 3C-SiC Films Grown on Si Substrates
E. Crespo, M. Ben el Mekki, G. Arnaud, J. Camassel
Research output: Contribution to journal › Article › Research
3
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(Scopus)