Roughness Effects in the Infrared Reflectance of Thick 3C-SiC Films Grown on Si Substrates

E. Crespo, M. Ben el Mekki, G. Arnaud, J. Camassel

Research output: Contribution to journalArticleResearch

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)12-22
JournalSPIE Press
Volume2648
Issue number0
Publication statusPublished - 1 Jan 1995

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