RIE induced damage in MOS structures

A. de Dios, E. Castán, L. Bailón, J. Barbolla, M. Lozano, LORA TAMAYO E.

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Cite this

@article{674933782b654005a080b5413270191b,

title = "RIE induced damage in MOS structures",

author = "Dios, \{A. de\} and E. Cast{\'a}n and L. Bail{\'o}n and J. Barbolla and M. Lozano and E., \{LORA TAMAYO\}",

year = "1990",

month = jan,

day = "1",

language = "English",

volume = "33",

pages = "1419--1423",

journal = "Solid-state electronics",

issn = "0038-1101",

publisher = "Elsevier Limited",

number = "11",

}

TY - JOUR

T1 - RIE induced damage in MOS structures

AU - Dios, A. de

AU - Castán, E.

AU - Bailón, L.

AU - Barbolla, J.

AU - Lozano, M.

AU - E., LORA TAMAYO

PY - 1990/1/1

Y1 - 1990/1/1

UR - https://www.scopus.com/pages/publications/0025516648

M3 - Article

SN - 0038-1101

VL - 33

SP - 1419

EP - 1423

JO - Solid-state electronics

JF - Solid-state electronics

IS - 11

ER -