Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tips

Mario Lanza Martínez; Albin Bayerl; M. Reguant; C. Rubio; Marc Porti Pujal; M Nafria; H. L. Duan

Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tips

Mario Lanza Martínez, Albin Bayerl , M. Reguant, C. Rubio, Marc Porti Pujal, M Nafria, H. L. Duan

Department of Electronic Engineering

Research output: Chapter in Book › Chapter › Research › peer-review

Original language	English
Title of host publication	Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computation (Volume 2), Chapter 6: NanoFab: Manufacturing & Instrumentation
Publisher	Nanoscience and Technology Institute
Pages	466
Number of pages	469
ISBN (Print)	978-1-4822-0584-8
Publication status	Published - 2013

Cite this

Lanza Martínez, M., Bayerl , A., Reguant, M., Rubio, C., Porti Pujal, M., Nafria, M., & Duan, H. L. (2013). Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tips. In Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computation (Volume 2), Chapter 6: NanoFab: Manufacturing & Instrumentation (pp. 466). Nanoscience and Technology Institute.

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title = "Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tips",

author = "\{Lanza Mart{\'i}nez\}, Mario and Albin Bayerl and M. Reguant and C. Rubio and \{Porti Pujal\}, Marc and M Nafria and Duan, \{H. L.\}",

year = "2013",

language = "English",

isbn = "978-1-4822-0584-8",

pages = "466",

booktitle = "Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computation (Volume 2), Chapter 6: NanoFab: Manufacturing \& Instrumentation",

publisher = "Nanoscience and Technology Institute",

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Lanza Martínez, M, Bayerl , A, Reguant, M, Rubio, C, Porti Pujal, M , Nafria, M & Duan, HL 2013, Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tips. in Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computation (Volume 2), Chapter 6: NanoFab: Manufacturing & Instrumentation. Nanoscience and Technology Institute, pp. 466.

Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tips. / Lanza Martínez, Mario; Bayerl , Albin; Reguant, M. et al.
Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computation (Volume 2), Chapter 6: NanoFab: Manufacturing & Instrumentation. Nanoscience and Technology Institute, 2013. p. 466.

Research output: Chapter in Book › Chapter › Research › peer-review

TY - CHAP

T1 - Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tips

AU - Lanza Martínez, Mario

AU - Bayerl , Albin

AU - Reguant, M.

AU - Rubio, C.

AU - Porti Pujal, Marc

AU - Nafria, M

AU - Duan, H. L.

PY - 2013

Y1 - 2013

M3 - Chapter

SN - 978-1-4822-0584-8

SP - 466

BT - Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computation (Volume 2), Chapter 6: NanoFab: Manufacturing & Instrumentation

PB - Nanoscience and Technology Institute

ER -

Lanza Martínez M, Bayerl A, Reguant M, Rubio C, Porti Pujal M , Nafria M et al. Reliable nanoscale electrical characterization using Graphene-coated Atomic Force Microscope tips. In Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computation (Volume 2), Chapter 6: NanoFab: Manufacturing & Instrumentation. Nanoscience and Technology Institute. 2013. p. 466