Quantum Mechanical modeling of accumulation layers in MOS structures

J. Suñé, P. Olivo, B. Riccò

Research output: Contribution to journalArticleResearch

92 Citations (Scopus)
Original languageEnglish
Pages (from-to)1732-1739
JournalIEEE Transactions on Electron Devices
Volume39
Issue number7
DOIs
Publication statusPublished - 1 Jan 1992

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