TY - JOUR
T1 - Pulsed Measurements Based Investigation of Trap Capture and Emission Processes in CNTFETs
AU - Weimer, Christoph
AU - Pacheco-Sanchez, Anibal
AU - Trommer, Jens
AU - Schroter, Michael
PY - 2021/5/21
Y1 - 2021/5/21
N2 - A study of reversible capture and emission processes of fabrication-caused interface and oxide traps in a carbon nanotube fet (cntfet) is performed. Drain-current-based measurement techniques are employed to investigate both the trap-related capture (fill) and the emission (release) process of these emerging three-terminal devices. The measurement techniques are based upon the systematic evaluation of the trap-induced time-dependent lateral shifts of periodically measured complete I d -V gs curves. The techniques are conceptually demonstrated by means of transient simulations with a cntfet compact model containing a trap modeling adjunct network with different time constants for capture and emission of traps. Subsequently, the techniques are experimentally applied to a cntfet using dedicated laboratory equipment.
AB - A study of reversible capture and emission processes of fabrication-caused interface and oxide traps in a carbon nanotube fet (cntfet) is performed. Drain-current-based measurement techniques are employed to investigate both the trap-related capture (fill) and the emission (release) process of these emerging three-terminal devices. The measurement techniques are based upon the systematic evaluation of the trap-induced time-dependent lateral shifts of periodically measured complete I d -V gs curves. The techniques are conceptually demonstrated by means of transient simulations with a cntfet compact model containing a trap modeling adjunct network with different time constants for capture and emission of traps. Subsequently, the techniques are experimentally applied to a cntfet using dedicated laboratory equipment.
UR - https://doi.org/10.1109/TNANO.2021.3080455
U2 - 10.1109/TNANO.2021.3080455
DO - 10.1109/TNANO.2021.3080455
M3 - Article
SN - 1536-125X
VL - 20
SP - 459
EP - 465
JO - IEEE Transactions on Nanotechnology
JF - IEEE Transactions on Nanotechnology
ER -