Proceedings of the Ninth European Syposium on Reliability of Electron Devices. "Two-step Stress Method for the dynamic testing of very thin (8nm) SiO2 films".: Ninth European Syposium on Reliability of Electron Devices.

R. Rodríguez; E. Miranda; M. Nafría; J. Suñé; X. Aymerich; F. Jensen; C. Kjaergaard

Proceedings of the Ninth European Syposium on Reliability of Electron Devices. "Two-step Stress Method for the dynamic testing of very thin (8nm) SiO2 films". Ninth European Syposium on Reliability of Electron Devices.

R. Rodríguez, E. Miranda, M. Nafría, J. Suñé, X. Aymerich, F. Jensen (Editor), C. Kjaergaard (Editor)

Department of Electronic Engineering

Research output: Book/Report › Proceeding › Research

Original language	Undefined/Unknown
Place of Publication	Anglaterra (GB)
Number of pages	5
Publication status	Published - Jun 1998

Cite this

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title = "Proceedings of the Ninth European Syposium on Reliability of Electron Devices. {"}Two-step Stress Method for the dynamic testing of very thin (8nm) SiO2 films{"}.: Ninth European Syposium on Reliability of Electron Devices.",

author = "R. Rodr{\'i}guez and E. Miranda and M. Nafr{\'i}a and J. Su{\~n}{\'e} and X. Aymerich",

editor = "F. Jensen and C. Kjaergaard",

year = "1998",

month = jun,

language = "Indefinido/desconocido",

}

TY - BOOK

T1 - Proceedings of the Ninth European Syposium on Reliability of Electron Devices. "Two-step Stress Method for the dynamic testing of very thin (8nm) SiO2 films".

T2 - Ninth European Syposium on Reliability of Electron Devices.

AU - Rodríguez, R.

AU - Miranda, E.

AU - Nafría, M.

AU - Suñé, J.

AU - Aymerich, X.

A2 - Jensen, F.

A2 - Kjaergaard, C.

PY - 1998/6

Y1 - 1998/6

M3 - Libro de Actas

BT - Proceedings of the Ninth European Syposium on Reliability of Electron Devices. "Two-step Stress Method for the dynamic testing of very thin (8nm) SiO2 films".

CY - Anglaterra (GB)

ER -