Proceedings of the 9th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM 97): Field induced oxidation of silicon by SPM: Study of the mechanism at negative sample voltage by STM, ESTM and AFM. 9th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM 97)

F Pérez, G Abadal, N Barniol, X Aymerich, - (Editor)

    Research output: Book/ReportProceedingResearch

    Original languageUndefined/Unknown
    Place of PublicationHamburg, Alemania (DE)
    Number of pages1
    Publication statusPublished - Jul 1997

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