Proceedings of the 1998 International Conference on Microelectronic Test Structures: "Test Structures for MCM-D Technology Characterization": IEEE International Conference on Microelectronic Test Structures - ICMT'98

M. Lozano, J. Santander, E. Cabruja, C. Perelló, M. Ullán, E. Lora-Tamayo, IEEE (Editor)

    Research output: Book/ReportProceedingResearch

    Original languageUndefined/Unknown
    Place of PublicationOsaka (JP)
    Number of pages6
    ISBN (Electronic)0780343484
    Publication statusPublished - Mar 1998

    Cite this