Proceedings of the 1998 International Conference on Microelectronic Test Structures: "Test Structures for MCM-D Technology Characterization": IEEE International Conference on Microelectronic Test Structures - ICMT'98

M. Lozano; J. Santander; E. Cabruja; C. Perelló; M. Ullán; E. Lora-Tamayo; null IEEE

Proceedings of the 1998 International Conference on Microelectronic Test Structures: "Test Structures for MCM-D Technology Characterization": IEEE International Conference on Microelectronic Test Structures - ICMT'98

M. Lozano, J. Santander, E. Cabruja, C. Perelló, M. Ullán, E. Lora-Tamayo, IEEE (Editor)

Research output: Book/Report › Proceeding › Research

Original language	Undefined/Unknown
Place of Publication	Osaka (JP)
Number of pages	6
ISBN (Electronic)	0780343484
Publication status	Published - Mar 1998

Cite this

@book{393f28321cc34b09ad95b5f036ff43e1,

title = "Proceedings of the 1998 International Conference on Microelectronic Test Structures: {"}Test Structures for MCM-D Technology Characterization{"}: IEEE International Conference on Microelectronic Test Structures - ICMT'98",

author = "M. Lozano and J. Santander and E. Cabruja and C. Perell{\'o} and M. Ull{\'a}n and E. Lora-Tamayo",

editor = "IEEE",

year = "1998",

month = mar,

language = "Indefinido/desconocido",

isbn = "0-7803-4348-4",

}

Proceedings of the 1998 International Conference on Microelectronic Test Structures: "Test Structures for MCM-D Technology Characterization" : IEEE International Conference on Microelectronic Test Structures - ICMT'98. / Lozano, M.; Santander, J.; Cabruja, E.; Perelló, C.; Ullán, M.; Lora-Tamayo, E.; IEEE (Editor).

Osaka (JP), 1998. 6 p.

Research output: Book/Report › Proceeding › Research

TY - BOOK

T1 - Proceedings of the 1998 International Conference on Microelectronic Test Structures: "Test Structures for MCM-D Technology Characterization"

T2 - IEEE International Conference on Microelectronic Test Structures - ICMT'98

AU - Lozano, M.

AU - Santander, J.

AU - Cabruja, E.

AU - Perelló, C.

AU - Ullán, M.

AU - Lora-Tamayo, E.

A2 - IEEE, null

PY - 1998/3

Y1 - 1998/3

M3 - Libro de Actas

SN - 0-7803-4348-4

BT - Proceedings of the 1998 International Conference on Microelectronic Test Structures: "Test Structures for MCM-D Technology Characterization"

CY - Osaka (JP)

ER -